Shimadzu (Asia Pacific)
Analytical and Measuring Instruments
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High-Resolution Scanning Probe Microscope
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Used for observation in a wide range. X·Y: 30 μm Z: 5 μm
Used to provide angled illumination in addition to standard coaxial incident illumination.
Used for observation in liquid. The dedicated cantilever holder is included.
This is a floor-type passive vibration damper. It requires a compressed air source.
This is a table-top active vibration damper. It only requires a power supply to function.
This is the active vibration damper unit combined as a set with a matching dedicated stand.
This table is for data processing equipment. A vertically oriented model is also available.
Extracts multiple particles from image data and calculates characteristic values for each particle.
This is used to eliminate static charge from samples or cantilevers.