LabSolutions CS features an innovative operating environment and provides complete data management to ensure secure information in networked laboratories.
SolidSpec-3700i/3700iDUV - Options
UV-VIS-NIR Spectrophotometer
Software: LabSolutions UV-Vis
The new spectrophotometer with the LabSolutions UV-Vis software which achieves labor-saving measurement provide a more convenient analytical environment. LabSolutions UV-Vis software with easy-to-use is included as standard.
UV Accessories & Options
LabSolutions Series
UV-Vis-NIR Spectroscopy Software
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Shimadzu UV-Vis makes your work faster and easier.
- Simple Easy to use for everyone
- Smart Optimize quality control
- Seamless Easy transfer of measurement data
Related information
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Shimadzu UV-Vis makes your work faster and easier.
- Simple Easy to use for everyone
- Smart Optimize quality control
- Seamless Easy transfer of measurement data -
Multifunctional Software with Multiple Measurement Functions / Enhanced GLP/GMP Support Functions
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Samples are placed in cells for measurements.
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This is used to measure samples, without diluting them, with an absorbance too high to be measured using a standard square cell with an optical path length of 10 mm.
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The following accessories are used to measure micro-volume samples.
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With relative specular reflectance measurement, the reflectance is calculated from the strength ratio after comparing the light reflected from the reference sample with the light reflected from the measurement sample.
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With absolute specular reflectance measurement, as shown in the figure, a reference sample is not used, the sample-free state (air) is set at 100%, and the reflection of the sample is simply applied to the 100% setting when measuring the sample.
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The transmittance of thin samples such as film with little scattering can be measured by combining the film holder with the standard sample compartment.
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This unit uses a lens and mask to mask the beam that passes through the integrating sphere opening.
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This software calculates the color values of the measured object from the spectra obtained by the spectrophotometer.
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This software calculates film thickness from the peak positions of the interference pattern caused by the film.