AXIS Supra+

Imaging X-Ray Photoelectron Spectrometer

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AXIS Supra+

Leading Surface Analysis

X-ray photoelectron spectroscopy (XPS) is unique in providing quantitative elemental and chemical state information from the uppermost 10 nm of a materials surface.  The AXIS Supra+ (also known as Kratos Ultra 2 in Japan) is a market leading X-ray photoelectron spectrometer combining state-of-the-art spectroscopic and imaging capabilities with the highest level of automation currently available.  
Unrivalled large area spectroscopic performance allows photoelectron spectra to be acquired from all types of materials including metals, semi-conductors and insulators.  Fast, high spatial resolution XPS imaging reveals the lateral distribution of surface chemistry and aids further characterisation with selected small area analysis.
The AXIS Supra+ is designed for flexibility allowing additional surface analysis and surface preparation options to be added without compromising XPS performance.  This makes it an invaluable tool for complete materials surface characterisation.

Features

  • Sensitivity
    Sensitivity
    The AXIS Supra+ provides excellent sensitivity in spectroscopy and XPS imaging modes.
  • ease of use
    Usability
    Versatile ESCApe software has been developed to make User interaction with the spectrometer as simple as possible, integrating acquisition and processing to fully exploit automation of the hardware.
  • surface imaging
    Parallel XPS imaging
    The lateral distribution of elements or chemistry at the surface is measured by XPS imaging.
  • resolution
    Resolution
    The very best resolution in spectroscopic and imaging mode is another fundamentally important property of any spectrometer.
  • full automation
    Automation
    Automation of the AXIS Supra+ improves the ease of use of the spectrometer and extends to all aspects of the spectrometer.
  • additional techniques
    Additional Analytical Techniques
    The AXIS Supra+ is more than a photoelectron spectrometer. It can be configured with a complete range of additional materials characterisation techniques, without compromising XPS performance.
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