EDX-LE

Energy dispersive X-ray Fluorescence spectrometer

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Model designed specifically for RoHS/ELV screening

EDX-LE is an X-ray fluorescence spectrometer designed specifically for screening elements regulated by RoHS/ELV directives. The model uses a detector (Si-PIN semiconductor detector) that does not require liquid nitrogen, thereby achieving lower operation cost and easier maintenance. Automated analysis functions improve operability without sacrificing its high level of inspection reliability. The time required from start of measurement to judgment is as short as one minute for some samples, which is very helpful in screening inspections for elements regulated by the RoHS directive. 

Features

  • EDX-LE
    Exceptional labor-saving, high-speed screening
    Lower operation cost, easier maintenance
    Provides specific functions necessary for screening the five RoHS regulated elements
    Easy set-up functions can be customized according to the management method
  • EDX-LE
    Easily carry out difficult tasks
    Easy operation from the [Screening Analysis] window
    All steps are automatically set from the the evaluation of major components to selection of conditions
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