ALTRACE - Applications

Energy Dispersive X-ray Fluorescence Spectrometer

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Food Products Field

Cacao powder, rice, powdered milk, etc          Calibration Curve Method  

Cadmium, arsenic, lead, and mercury are highly regulated in food products due to their inherent toxicity. A maximum allowable value of less than 1 ppm is specified. ALTRACE can detect these levels, and as low as 0.1 mg/kg, in food products. 

Analysis Results For Standard Sample NMIJ7502-a

 

Analysis Results for Standard Sample NMIJ7502-a

Calibration Curve Method

Calibration Curve Method

In the calibration curve method, standard samples are measured, and the relationship between standard concentration and X-ray intensity is manifested in a curve. The curve can be used to quantify samples of unknown concentration.

Standard samples should be composed of a similar matrix as the unknown. In addition, a curve must be made for each target element. Calibration curve methods can provide high accuracy and quantitative data. Correction methods, such as absorption/excitation correction, overlapping correction, and other methods, are supported.

 

Chemical Products And Soil

Raw materials for chemical products (liquids and powders)          FP Qualitative and Quantitative Analysis  

Energy dispersive X-ray fluorescence spectrometers are used in fields related to the environment. Powdered and granular samples can be placed in a sample cell and analyzed as is, without dissolving them. Soil contains a variety of elements. After performing a qualitative analysis of such elements, a quantitative analysis is performed using the FP method.

Analysis Results for Soil Samples

 

Analysis Results for Soil Samples

FP Method

The FP method determines the elemental composition using a theoretical intensity calculation. Useful for quantitative methods where it is difficult to procure standards. For samples where the main components are C, H, and O, a balance (residue) setting is required, which can be determined by the user beforehand or theoretically using the shape of the scattered X-ray profile.

Background FP Method

The background FP method uses the intensity of scattered X-rays (background) to further correct for matrix effects.

Background FP Method